WebLatch-Up Testing Methods www.ti.com 6 SCAA124–April 2015 Submit Documentation Feedback Copyright © 2015, Texas Instruments Incorporated Latch-Up 2.2 Current ... Web• Latch-up performance exceeds 100 mA per JESD78D Class II • Inputs accept voltages up to 2.75 V • Low noise overshoot and undershoot < 10% of VCCO • IOFF circuitry provides partial power-down mode operation • Multiple package options • Specified from -40 °C to +85 °C. Nexperia 74AXP1T34 Dual supply translating buffer
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Web1 apr 2016 · JEDEC JESD 78. April 1, 2016. IC Latch-Up Test. This standard covers the I-test and Vsupply overvoltage latch-up testing of integrated circuits. The purpose of this … Web± 100 mA Class II JEDEC JESD78D Electrostatic Discharge ESD HBM Electrostatic Discharge HBM ± 2000 V Norm: JS-001-2014 Temperature Ranges and Storage Conditions T J Operating Junction Temperature 85 °C T STRG Storage Temperature Range - 55 125 °C T BODY Package Body Temperature 260 °C IPC/JEDEC J-STD-020 (1) RH NC cheap exhaust mufflers
Standards & Documents Search JEDEC
WebJEDEC Standard No. 78B Page 2 2 Terms and definitions The following terms and definitions apply to this test method. cool-down time: The period of time between successive applications of trigger pulses, or the period of time between the removal of the V supply voltage and the application of the next trigger pulse. (See Figures 2, Web1 dic 2024 · JEDEC STANDARD IC Latch-Up Test JESD78E (Revision of JESD78D, November 2011) APRIL 2016 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION … WebJESD78F.01. Dec 2024. This standard covers the I-test and Vsupply overvoltage latch-up testing of integrated circuits. The purpose of this standard is to establish a method for … cvs orleans mass covid testing